MOSFETs replace every 200–400 Gy and cap at 5 per reader. BeO OSL changes both of those constraints.

myOSL™ Chip

Reusable, with ~2 % sensitivity drift then stable

Each BeO chip is erasable and re-usable. Characterised sensitivity drift is approximately −2 % over the first 0–15 Gy cumulative dose, after which sensitivity is essentially stable to 32 Gy (the upper bound of the cited study). Reuse cycles are limited only by handling damage to the housing, not by saturation of the detector.

Source: Kowalski J et al., JACMP 26(4):e70057 (2025) — characterisation, commissioning and clinical evaluation of a commercial BeO OSL system.

MOSFET dosimeter

Replaced every 200–400 Gy cumulative

MOSFETs accumulate charge in the gate oxide with every irradiation. Once the cumulative service dose reaches the manufacturer-specified threshold — typically 200–400 Gy depending on the model — the dosimeter must be replaced (the threshold-voltage shift no longer tracks dose linearly).

Source: mobileMOSFET system documentation, Best Medical / RPDinc; characterisation literature (Cygler & Scarantino, AAPM 2009).

myOSL™ Chip

No fixed channel limit

myOSL Chips are passive — each is read out on the bench, after irradiation, by the handheld myOSL reader. As many chips as you have are read sequentially. There is no hardware ceiling on the number of in-vivo points per fraction; only operator time on the reader after the fact.

Source: Manufacturer workflow specification (handheld myOSLchip reader).

MOSFET dosimeter

Up to 5 MOSFETs per reader module

The mobileMOSFET Wireless Dosimetry System reader accepts up to 5 MOSFETs or one Linear 5ive Array per module. Scaling beyond 5 requires additional reader modules and transceivers — five concurrent dose points is the per-module ceiling.

Source: mobileMOSFET Wireless Dosimetry System, 5 Dose Points, 1 Reader Module — RPDinc product specification.

myOSL™ Chip

Reader + reusable chips — capital + minimal consumable

After the reader is purchased, the per-measurement cost is essentially zero until physical damage takes a chip out of service. Linearity, fading and angular response are characterised on every reuse via the type-test protocol.

Source: Manufacturer service model.

MOSFET dosimeter

Reader + recurring detector replacements

Each MOSFET has a finite cumulative-dose service life (200–400 Gy). A clinic running routine in-vivo dosimetry across multiple fractions and patients reaches that ceiling on a predictable cadence — detector replacement becomes a recurring consumable line on the QA budget.

Source: mobileMOSFET service documentation.